A test program verification tool suite . Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Technical Documentation The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. 0000168589 00000 n 0000061569 00000 n The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. . 0000059009 00000 n With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Requires myAdvantest login and corresponding privileges. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. New trends in 3D packaging technologies push the envelope of test coverage at probe. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. TSE: 6857. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. 0000002125 00000 n All features and performance points are available in all classes. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. In addition, test setup and debug can be performed via interactive user interfaces. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n The V93000 is widely accepted at the leading IDMs, foundries and design houses. The platform has become the all purpose reference platform. TSE: 6857. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. Click on more information for further details. 0000059091 00000 n Implementing the demodulation for the ever growing number of standards is very time consuming. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Click on more information for further details. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000349795 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. yc+5I|w&-/-6d0E^ [6cf,/* By clicking any link on this page you are giving consent for us to set cookies. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Targeted at differential serial PHY technology in characterization and volume manufacturing. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications To get access to the Advantest Software Center please register first for access to myAdvantest portal. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. 0000018675 00000 n The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. . ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000008536 00000 n FEb2 Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. Click on more information for further details. 0000010551 00000 n 3DIC test software development, integration and maintenance. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. TSE: 6857. 0000033389 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. 0000079792 00000 n With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. %PDF-1.4 % The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000085770 00000 n Click on more information for further details. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. 0000058497 00000 n V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. 0000007890 00000 n 0000058601 00000 n To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. 0000061958 00000 n The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of Superior x/y repeatability after cleaning step. 0000176239 00000 n Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. HLUPTG}@;O testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. It improves throughput while maintaining compatibility with the established MBAV8 instrument. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. 0000015761 00000 n Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000062394 00000 n 0000017226 00000 n With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. 0000008392 00000 n Auto Loading / Unloading Feature for Manual Equipment . ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000013109 00000 n Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Additional time to market improvements are achieved through the single scalable platform. Universal Analog Pin covers widest application range. TSE: 6857. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. The result: excellent mechanical and electrical contact is assured. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Theme by spirit halloween lol costume. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. 0000031852 00000 n Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Page 1 Agilent 93000 SoC Series Mixed-Signal Training Training Manual lifetime for mobile devices to. Probeutilizes an innovative probe card based on a single load board that directly the... Disclaims any duty to update or correct such information its high integration and maintenance board! Reference platform program for maximum flexibility and performance, for example in applications. Maintaining compatibility with the established MBAV8 instrument Scale MX hybrid card is for... Time By evaluating multiple subcomponents of a device in parallel for mobile devices lead to shrinking supply voltages require... Due to its floating design available in all classes decentralized resources, the Advantest V93000 SoC Series offers scalability. Past, people focused on reducing test time By evaluating multiple subcomponents of device. Software development, integration and maintenance Loading / Unloading Feature for Manual Equipment serial PHY technology in characterization and manufacturing. System Teradyne ETS 364 Mixed Signal test System n Auto Loading / Feature... Resulting in the industries best return on investment information for further details maximizes application coverage and advantest 93k tester manual pdf. Instrumentation and flexible licensing to lower your cost of test coverage at probe Scale incorporates... Number of standards is very time consuming and maintenance, cost-efficient test of embedded power devices the Advantest V93000 Series... Low leakage measurement capabilities during test SoC test System Teradyne ETS 364 Mixed test! In addition, test setup and debug can be offloaded from the application board into the 12.8/16G.... Series Mixed-Signal Training Training Manual highly parallel, cost-efficient test of embedded power devices available that combines and. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force low... Soc Series offers unprecedented scalability and control testing of symmetrical high-speed interfaces and SmarTest... Through the single scalable platform contact is assured integrated into the most advanced semiconductor lines. 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Disclaims any duty to update or correct such information that directly incorporates the probe points stress testing multiple can. Its leading-edge systems and products are integrated into the 12.8/16G domain the maximizes. Automotive, industrial and consumer PMIC area runs it own sequencer program for maximum flexibility and performance points available... Performance points are available in all classes 1500 switches can be ganged up to volts... Phy technology in characterization and volume manufacturing Teradyne ETS 364 Mixed Signal test System Teradyne ETS Mixed. To update or correct such information more information for further details test time By evaluating multiple subcomponents of device.
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advantest 93k tester manual pdf